Ministry of Education
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Prof Abhisek Dixit

vidwan id: 70121
Male

Professor, Department of Electrical Engineering
Indian Institute of Technology Delhi

Google Scholar Icon 55798800800

Expertise

  • Electrical and Electronic Engineering

Publications

Total Articles 124
Books 0
Proceedings 0

Publications

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Scopus

Citations 2014
h-index 23

CrossRef

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Citations 1156
h-index 16
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Professional Recognition

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Community & Membership

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Bio

Logic CMOS device design and characterization, CMOS variability, reliability and thermal-effects, Agressively scaled CMOS embedded DRAM (eDRAM) and SRAM cells, Compact device moldeing and process design kits (PDK), Modeling and characterization of Si solar-cells and modules

Personal Details

  • Male
  • Professor , Indian Institute of Technology Delhi
  • Indian Institute of Technology Delhi, Hauz Khas
Dr. Engg.
Other Institute 2007
Professor May 2021 – Present
Indian Institute of Technology Delhi | Department of Electrical Engineering
Associate Professor Oct 2013 – Nov -0001
Indian Institute of Technology Delhi | Department of Electrical Engineering

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Co-Authors (12)

Anil

Dr Anil Kottantharayil

Indian Institute of Technology Bombay

Bhaskar

Prof Bhaskar Mitra

Indian Institute of Technology Delhi

Yogesh Singh

Dr Yogesh Singh Chauhan

Indian Institute of Technology Kanpur

Manoj

Dr Manoj Kumar

CSIR-National Metallurgical Laboratory

Madhusudan

Prof Madhusudan Singh

Indian Institute of Technology Delhi

Pragya

Dr Pragya Kushwaha

Indian Institute of Technology Jodhpur

Rajan Kumar

Dr Rajan Kumar Pandey

Vellore Institute of Technology, Vellore

Ravikant

Dr Ravikant Saini

Indian Institute of Technology Jammu

Ramchandra

Dr Ramchandra Gurjar

Shri G. S. Institute of Technology & Science, Indore

Rajiv O

Dr Rajiv O Dusane

Indian Institute of Technology Bombay

V. Ramgopal

Prof V. Ramgopal Rao

Birla Institute of Technology and Science

Mohit

Dr Mohit Bajaj

Graphic Era University, Dehradun

Scholarly Work

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Scholarly Publications

Impact of Hot Carrier Injection on Total Ionizing Dose Effect of 10-nm N-channel Bulk FinFETs

Open Access
Conference Paper
Year: 2020.
Authors: Yogi P.;Kumar M.;Aditya K.;Gupta C.;Dixit A.
DOI 10.1109/ICEE50728.2020.9776895
4

Effect of Self-Heating on Linearity of Novel Junctionless Accumulation Mode Negative Capacitance FinFET

Open Access
Conference Paper
Year: 2020.
Authors: Kumar M.;Dixit A.
DOI 10.1109/ICEE50728.2020.9776730
1

Heavy-Ion Induced Single Event Transients in Sub-7nm Bulk and SOI NSFETs

Open Access
Conference Paper
Year: 2020.
Authors: Jha C.K.;Rathi A.;Yogi P.;Aditya K.;Dixit A.
DOI 10.1109/ICEE50728.2020.9776740
4

Comparison of LER induced mismatch in NWFET and NSFET for 5-nm CMOS

Open Access
Article
IEEE Journal of the Electron Devices Society. Year: 2020. Volume: 8 , Pages: 1184-1192 .
Authors: Jha C.K.;Yogi P.;Gupta C.;Gupta A.;Vega R.A.;Dixit A.
DOI 10.1109/JEDS.2020.3026534
1 8

A Junctionless Accumulation Mode NC-FinFET Gate Underlap Design for Improved Stability and Self-Heating Reduction

Open Access
Article
IEEE Transactions on Electron Devices. Year: 2020. Volume: 67 , Issue: 8 , Pages: 3424-3430 .
Authors: Kumar M.;Aditya K.;Dixit A.
DOI 10.1109/TED.2020.2997848
4 16

Impact of LER on Mismatch in Nanosheet Transistors for 5nm-CMOS

Open Access
Conference Paper
Year: 2020.
Authors: Jha C.K.;Gupta C.;Gupta A.;Vega R.A.;Dixit A.
DOI 10.1109/EDTM47692.2020.9117816
8

Impact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-Channel FinFETs with self-heating

Open Access
Article
IEEE Transactions on Electron Devices. Year: 2020. Volume: 67 , Issue: 5 , Pages: 2208-2212 .
Authors: Gupta C.;Gupta A.;Vega R.A.;Hook T.B.;Dixit A.
DOI 10.1109/TED.2020.2977734
2 13