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Prof Abhisek Dixit

vidwan id: 70121
Male

Professor, Department of Electrical Engineering
Indian Institute of Technology Delhi

Expertise

  • Electrical and Electronic Engineering

Publications

Total Articles 124
Books 0
Proceedings 0

Publications

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Scopus

Citations 2014
h-index 23

CrossRef

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Citations 1156
h-index 16
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Professional Recognition

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Community & Membership

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Bio

Logic CMOS device design and characterization, CMOS variability, reliability and thermal-effects, Agressively scaled CMOS embedded DRAM (eDRAM) and SRAM cells, Compact device moldeing and process design kits (PDK), Modeling and characterization of Si solar-cells and modules

Personal Details

  • Male
  • Professor , Indian Institute of Technology Delhi
  • Indian Institute of Technology Delhi, Hauz Khas
Dr. Engg.
Other Institute 2007
Professor May 2021 – Present
Indian Institute of Technology Delhi | Department of Electrical Engineering
Associate Professor Oct 2013 – Nov -0001
Indian Institute of Technology Delhi | Department of Electrical Engineering

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Organisations (800+)

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Bhupendra Singh

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Bhim

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SERB National Science Chair and Emeritus Professor

Arudra Venkata

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Co-Authors (12)

Anil

Dr Anil Kottantharayil

Indian Institute of Technology Bombay

Bhaskar

Prof Bhaskar Mitra

Indian Institute of Technology Delhi

Yogesh Singh

Dr Yogesh Singh Chauhan

Indian Institute of Technology Kanpur

Manoj

Dr Manoj Kumar

CSIR-National Metallurgical Laboratory

Madhusudan

Prof Madhusudan Singh

Indian Institute of Technology Delhi

Pragya

Dr Pragya Kushwaha

Indian Institute of Technology Jodhpur

Rajan Kumar

Dr Rajan Kumar Pandey

Vellore Institute of Technology, Vellore

Ravikant

Dr Ravikant Saini

Indian Institute of Technology Jammu

Ramchandra

Dr Ramchandra Gurjar

Shri G. S. Institute of Technology & Science, Indore

Rajiv O

Dr Rajiv O Dusane

Indian Institute of Technology Bombay

V. Ramgopal

Prof V. Ramgopal Rao

Birla Institute of Technology and Science

Mohit

Dr Mohit Bajaj

Graphic Era University, Dehradun

Scholarly Work

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Scholarly Publications

Flicker Noise (1/f) in 45-nm PDSOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications

Open Access
Article

Investigation and Modeling of Multifrequency CV characteristics for 10-nm Bulk FinFETs at Cryogenic Temperatures

Open Access
Article
Authors: Gupta S.;Amin A.;Vega R.A.;Dixit A.

AC-TDDB Behavior in 45 nm PDSOI Ultra-Thin Gate Oxide FETs Using SILC Spectroscopy

Open Access
Article

Reliability assessment of high-power GaN-HEMT devices with different buffers under influence of gate bias and high-temperature tests

Open Access
Article

Analysis and Modeling of DC-IV and Flicker Noise Characteristics of 180-nm Bulk Planar NFETs at Cryogenic Temperatures

Open Access
Conference Paper
Authors: Pathak S.;Gupta S.;Sharma D.;Rathi A.;Dixit A.

Impact of temperature on threshold voltage instability under negative bias in ferroelectric charge trap (FEG) GaN-HEMT

Open Access
Article

Impact of Gate Oxide Thickness on Flicker Noise (1/f) in PDSOI n-channel FETs

Open Access
Article
Authors: Pathak S.;Gupta S.;Rathi A.;Srinivasan P.;Dixit A.

Multiple-Gate FET Quantum Dot Behavior and a Proximity Charge Sensing Model

Open Access
Article