Expertise
- Electrical and Electronic Engineering
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Professional Recognition
Region 8 Exemplary Student Branch Award under my mentorship as a Student Branch counsellor
IEEECommunity & Membership
International Conference on Engineering Research and Innovations
Co-chairInternational Conference on Engineering Research and Innovations
Co-chairIndian Society for Technical Education
Bio
CMOS Device Reliability, Device Characterization, SOPC Design
Personal Details
- Male
- Associate Professor , University of Mumbai
- Sector-22, Mumbai
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Indian Institute of Technology Hyderabad
Indian Institute of Technology Bombay
Scholarly Work
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Scholarly Publications
Negative Bias Temperature Instability for SiON p-MOSFETs
Open AccessMaterial dependence of Negative Bias Temperature Instability (NBTI) stress and recovery in SiON p-MOSFETs
Open AccessOn the differences between ultra-fast NBTI measurements and reaction-diffusion theory
Open AccessA common framework of NBTI generation and recovery in plasma-nitrided SiON p-MOSFETs
Open Access
10.1109/LED.2009.2026436
11
14
A Comparative NBTI Study of $\hboxHfO_2$, $\hboxHfSiO_x$, and SiON p-MOSFETs Using UF-OTF $I_\rm DLIN$ Technique
Open AccessIsolation of NBTI stress generated interface trap and hole-trapping components in PNO p-MOSFETs
Open Access
10.1109/TED.2008.2010569
61
70