Ministry of Education
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Dr Mohammed Hussain Modi

vidwan id: 58832
Male

Associate Professor,
Raja Ramanna Centre for Advanced Technology

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Expertise

  • Multidisciplinary Physics

Publications

Total Articles 56
Books 0
Proceedings 0

Publications

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Scopus

Citations 303
h-index 10

CrossRef

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Citations 171
h-index 6
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Community & Membership

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Bio

Thin Film and Multilayers, Optical Properties of Materials in X-Ray Region, Synchrotron Beamlines and Related Areas, X-Ray Reflectivity and Resonant X-Ray Scattering.

Personal Details

  • Male
  • Associate Professor , Raja Ramanna Centre for Advanced Technology
  • Rajendra Nagar, Indore, Madhya Pradesh, India
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Associate Professor — – Present
Raja Ramanna Centre for Advanced Technology

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Organisations (12+)

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KUNWAR

Dr KUNWAR BARTWAL

Scientific Officer G

Alok

Dr Alok Dube

Scientific Officer H

Mukesh

Prof Mukesh Joshi, Indore

Scientific Officer H

Harish

Mr Harish Kumar

Scientific Officer F

Manoj Kumar

Mr Manoj Kumar Singh

N/A

Anand

Dr Anand Moorti

Professor

Srinibas

Dr Srinibas Satapathy

Scientific Officer G

S. Senthil

Mr S. Senthil Kumar

Scientific Officer F

Rajiv

Mr Rajiv Jain

Scientific Officer G

Sandeep

Mr Sandeep Talwar

Scientific Officer G

Co-Authors (10)

ANIL

Prof ANIL SINHA

University of Petroleum and Energy Studies, Dehradun

Amol

Dr Amol Singh

N/A

Juzer Ali

Dr Juzer Ali Chakera

Raja Ramanna Centre for Advanced Technology

Pankaj

Prof Pankaj Srivastava

Indian Institute of Technology Delhi

Pankaj

Dr Pankaj Srivastava

Banaras Hindu University

Pradeep Kumar

Prof Pradeep Kumar Gupta

Indian Institute of Science Education and Research(IISER), Bhopal

Santanu

Prof Santanu Ghosh

Indian Institute of Technology Delhi

Sindhunil Barman

Dr Sindhunil Barman Roy

Raja Ramanna Centre for Advanced Technology

Shailendra

Dr Shailendra Kumar

Raja Ramanna Centre for Advanced Technology

Anil Kumar

Dr Anil Kumar Sinha

Central Road Research Institute

Scholarly Work

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Scholarly Publications

Optical constants of e-beam-deposited zirconium dioxide measured in the 55–150 Å wavelength region using the reflectivity technique

Open Access
Article
Applied Optics. Year: 2016. Volume: 55 , Issue: 12 , Pages: 3170-3175 .
Authors: Singh, Amol;Sinha, Mangalika;Gupta, R. K.;Modi, Mohammed H.
DOI 10.1364/ao.55.003170

Influence of structural disorder on soft x-ray optical behavior of NbC thin films

Open Access
Article
Journal of Applied Physics. Year: 2015. Volume: 117 , Issue: 17 .
Authors: Singh A.;Modi M.H.;Rajput P.;Sinha A.K.;Lodha G.S.
DOI 10.1063/1.4919427
6 5

Optical properties of zirconium carbide in 60–200  Å wavelength region using x-ray reflectivity technique

Open Access
Article
Applied Optics. Year: 2015. Volume: 54 , Issue: 2 , Pages: 253-258 .
Authors: Singh, Amol;Modi, Mohammed H.;Lodha, G. S.
DOI 10.1364/ao.54.000253

Study of structural and optical properties of zirconium carbide (ZrC) thin-films deposited by ion beam sputtering for soft x-ray optical applications

Open Access
Article
Surface and Coatings Technology. Year: 2015. Volume: 272 , Pages: 409-414 .
Authors: Singh A.;Modi M.H.;Sinha A.K.;Dhawan R.;Lodha G.S.
DOI 10.1016/j.surfcoat.2015.03.033
14 14

Analysis of higher harmonic contamination with a modified approach using a grating analyser

Open Access
ARTICLE
Review of Scientific Instruments. Year: 2014. Volume: 85 , Pages: 173-178 .
Authors: Gupta, Rajkumar;Modi, Mohammed H.;Kumar, M.;Chakera, J. A.;Lodha, G. S.
DOI 10.1063/1.4870896

Structure and composition of zirconium carbide thin-film grown by ion beam sputtering for optical applications

Open Access
Conference Paper
AIP Conference Proceedings. Year: 2014. Volume: 1591 , Pages: 869-871 .
Authors: Singh, Amol;Modi, Mohammed H.;Dhawan, Rajnish;Lodha, G. S.
DOI 10.1063/1.4872785

Comparison of Mo/Si and NbC/Si lamellar multilayer gratings near Si absorption edge

Open Access
Conference Paper
AIP Conference Proceedings. Year: 2014. Volume: 1591 , Pages: 687-689 .
Authors: Niranjan, Ankita;Modi, Mohammed H.;Singh, Amol;Idir, Mourad;Lodha, G. S.
DOI 10.1063/1.4872720

Study of growth kinetics and depth resolved composition of a-SiN x :H thin films by resonant soft X-ray reflectivity at the Si L 2,3 -edge

Open Access
Article
Applied Surface Science. Year: 2014. Volume: 305 , Pages: 173-178 .
Authors: Bommali R.K.;Modi M.H.;Zhou S.;Ghosh S.;Srivastava P.
DOI 10.1016/j.apsusc.2014.03.033
3 4