Vidvan Image

Dr Mohammed Hussain Modi

vidwan id: 58832
Male

Associate Professor,
Raja Ramanna Centre for Advanced Technology

Expertise

  • Multidisciplinary Physics

Publications

Total Articles 56
Books 0
Proceedings 0

Publications

No publication activity to display at the moment.

Scopus

Citations 303
h-index 10

CrossRef

CrossRef Icon
Citations 171
h-index 6
Google Scholar

Loading Scholar statistics...

Professional Recognition

No Data Found

There is currently nothing to display here.

Community & Membership

No Data Found

There is currently nothing to display here.

No Data Found

There is currently nothing to display here.

Bio

Thin Film and Multilayers, Optical Properties of Materials in X-Ray Region, Synchrotron Beamlines and Related Areas, X-Ray Reflectivity and Resonant X-Ray Scattering.

Personal Details

  • Male
  • Associate Professor , Raja Ramanna Centre for Advanced Technology
  • Rajendra Nagar, Indore, Madhya Pradesh, India
No Data Found

There is currently nothing to display here.

Associate Professor — – Present
Raja Ramanna Centre for Advanced Technology

Related Profiles

Experts (2063+)

View All
Boyella

Mr Boyella Sreenivasa Reddy

Assistant Professor

Aman

Mr Aman Kumar

Assistant Professor

Manish Kumar

Dr Manish Kumar Vishwakarma

Assistant Professor

Monika

Dr Monika DL

Assistant Professor

Usha

Usha S

Assistant Professor

Prashant

Dr Prashant Athmakoori

Assistant Professor

Krishna

Dr Krishna Chandra Mishra

Assistant Professor

Sudipta

Ms Sudipta Chakrabarty

Assistant Professor

Eena

Dr Eena Bahan

Assistant Professor

Sunita

Ms Sunita Loohach

Assistant Professor

Organisations (12+)

View All
KUNWAR

Dr KUNWAR BARTWAL

Scientific Officer G

Alok

Dr Alok Dube

Scientific Officer H

Mukesh

Prof Mukesh Joshi, Indore

Scientific Officer H

Harish

Mr Harish Kumar

Scientific Officer F

Srinibas

Dr Srinibas Satapathy

Scientific Officer G

S. Senthil

Mr S. Senthil Kumar

Scientific Officer F

Rajiv

Mr Rajiv Jain

Scientific Officer G

Sandeep

Mr Sandeep Talwar

Scientific Officer G

Co-Authors (10)

ANIL

Prof ANIL SINHA

University of Petroleum and Energy Studies, Dehradun

Juzer Ali

Dr Juzer Ali Chakera

Raja Ramanna Centre for Advanced Technology

Pankaj

Prof Pankaj Srivastava

Indian Institute of Technology Delhi

Pankaj

Dr Pankaj Srivastava

Banaras Hindu University

Pradeep Kumar

Prof Pradeep Kumar Gupta

Indian Institute of Science Education and Research(IISER), Bhopal

Santanu

Prof Santanu Ghosh

Indian Institute of Technology Delhi

Sindhunil Barman

Dr Sindhunil Barman Roy

Raja Ramanna Centre for Advanced Technology

Shailendra

Dr Shailendra Kumar

Raja Ramanna Centre for Advanced Technology

Anil Kumar

Dr Anil Kumar Sinha

Central Road Research Institute

Scholarly Work

No Data Found

There is currently nothing to display here.

No Data Found

There is currently nothing to display here.

No Data Found

There is currently nothing to display here.

Scholarly Publications

Effect of soft X-ray/VUV illumination on soft matter thin film

Open Access
Conference Proceedings
Authors: Naik, S. R.;Modi, M. H.;Pandit, P.;Lodha, G. S.;Gupta, A.

Study of micro roughness parameters and growth characteristics of NbC/Si multilayer using layer by layer power spectral density analysis

Open Access
Conference Proceedings
Authors: Modi, Mohammed H.;Lodha, G. S.;Thomasset, M.;Idir, Mourad

X-ray optics simulation using Gaussian superposition technique

Open Access
ARTICLE
Authors: Idir, Mourad;Cywiak, Moisés;Morales, Arquímedes;Modi, Mohammed H.

Study of the optical response of Si-rich a-SiNx : H thin film near Si L2,3-edge using soft x-ray reflectivity

Open Access
Article

Qualitative estimation of Si-rich a-SiNx:H thin film composition by soft X-ray reflectivity analysis

Open Access
Conference Paper

Growth kinetics and compositional analysis of silicon rich a-SiN x:H film: A soft x-ray reflectivity study

Open Access
Article

Highly resistive AIN formation in TiN / AlCu / TiN stack evidenced by EELS TEM and XPS

Open Access
Conference Proceedings
Authors: Delahaye, B., Fray, H., Brun, J.P., Guilbaud, N., Tabary, P., Lariviere, S., Basso, D., Modi, M., Idir, M.

Resonant soft X-ray reflectivity as a sensitive probe to investigate polished zinc sulphide surface

Open Access
Article