Ministry of Education
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Mr Asish Kumar Singh

vidwan id: 215963
Male

Senior Scientist, Vacuum Electron Devices Development Group
Central Electronics Enginnering Research Institute

Google Scholar Icon 57223752460;57223752458

Expertise

  • Electrical and Electronic Engineering

Publications

Total Articles 12
Books 0
Proceedings 0

Publications

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Scopus

Citations 24
h-index 3

CrossRef

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Citations 17
h-index 3
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Bio

Thermionic Cathodes for Use in High Power Microwave Tubes

Personal Details

  • Male
  • Senior Scientist , Central Electronics Enginnering Research Institute
  • Central Electronics Engineering Research Institute, Pilani
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Senior Scientist Mar 2020 – Present
Central Electronics Enginnering Research Institute | Vacuum Electron Devices Development Group

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Organisations (74+)

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Brijendra Kumar

Mr Brijendra Kumar Verma

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Ayan Kumar

Dr Ayan Kumar Bandyopadhyay

Principal Scientist

Avanish

Dr Avanish Bhadauria

Principal Scientist

Asish Kumar

Mr Asish Kumar Singh

Senior Scientist

Anirban

Dr Anirban Bera

Principal Scientist

Bhausaheb Ashok

Dr Bhausaheb Ashok Botre

Principal Scientist

Anand

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Anand

Mr Anand Abhishek

Scientist

Anil

Dr Anil Saini

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Akshansh

Dr Akshansh Gupta

Scientist

Co-Authors (6)

Jayasankar

Dr Jayasankar K

National Institute for Interdisciplinary Science & Technology

Mayadhar

Dr Mayadhar Debata

Institute of Minerals and Materials Technology

Ranjan Kumar

Dr Ranjan Kumar Barik

Central Electronics Enginnering Research Institute

Rajesh

Prof Rajesh Kumar

Malaviya National Institute of Technology Jaipur

Rahul

Dr Rahul Prajesh

Central Electronics Enginnering Research Institute

Sushil Kumar

Dr Sushil Kumar Shukla

Central Electronics Enginnering Research Institute

Scholarly Work

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Scholarly Publications

A Review of Electron Emitters for High-Power and High-Frequency Vacuum Electron Devices

Open Access
Review
IEEE Transactions on Plasma Science. Year: 2020. Volume: 48 , Issue: 10 , Pages: 3446-3454 .
Authors: Singh A.K.;Shukla S.K.;Ravi M.;Barik R.K.
DOI 10.1109/TPS.2020.3011285
3

Synthesis of Rhenium–Scandia doped tungsten nanoparticles for shrinkage investigation

Open Access
Article
Journal of Sol-Gel Science and Technology. Year: 2020. Volume: 95 , Issue: 2 , Pages: 384-392 .
Authors: Shukla S.K.;Singh A.K.;Barik R.K.
DOI 10.1007/s10971-020-05253-8
1 1

Erratum: Study and Development of Active Sintered Controlled Porosity Dispenser Cathode (IEEE TRANSACTIONS on ELECTRON DEVICES (2015) 62:11 (3837–3843) DOI: : 10.1109/TED.2015.2478970)

Open Access
Erratum
IEEE Transactions on Electron Devices. Year: 2020. Volume: 67 , Issue: 10 , Pages: 4546 .
Authors: Singh A.K.
DOI 10.1109/TED.2020.3012423

Erratum: Design and development of thermionic emission microscope for the characterization of a multi-beam cathode(Ultramicroscopy (2019) 202(140–147)(S0304-3991(18)30295-X)(10.1016/j.ultramic.2019.04.012))

Open Access
Erratum
Ultramicroscopy. Year: 2019. Volume: 206 .
Authors: Shukla S.K.;Singh A.K.;Pradhan S.K.;Barik R.K.
DOI 10.1016/j.ultramic.2019.112822

Synthesis and characterization of nano-brazing alloy for thermionic dispenser cathode application

Open Access
Article
Journal of Electromagnetic Waves and Applications. Year: 2017. Volume: 31 , Issue: 18 , Pages: 2074-2080 .
Authors: Singh A.K.;Shukla S.K.;Bisht M.S.;Rahaman S.E.;Kalidoss J.;Debata M.;Barik R.K.
DOI 10.1080/09205071.2017.1357505

Design of high efficiency and high thrust grid system for ion thruster

Open Access
Article
Journal of Electromagnetic Waves and Applications. Year: 2017. Volume: 31 , Issue: 17 , Pages: 1816-1825 .
Authors: Rahaman S.E.;Barik R.K.;Singh A.K.;Shukla S.K.;Min S.H.;Park G.S.
DOI 10.1080/09205071.2017.1349002

Analytical Modeling of Low Erosion Extraction Grid for Ion Thruster

Open Access
Article
IEEE Transactions on Plasma Science. Year: 2017. Volume: 45 , Issue: 11 , Pages: 2974-2978 .
Authors: Rahaman S.E.;Singh A.K.;Shukla S.K.;Barik R.K.
DOI 10.1109/TPS.2017.2752260
1

Study and Development of Yttrium-Doped Nanoscandate Cathode for High-Power VEDs

Open Access
Article
IEEE Transactions on Electron Devices. Year: 2016. Volume: 63 , Issue: 12 , Pages: 4975-4980 .
Authors: Shukla S.K.;Singh A.K.;Singh T.P.;Saini S.K.;Poonia R.K.;Raju R.S.;Barik R.K.
DOI 10.1109/TED.2016.2619353
4 5