Prof Rahul Bhattacharya

Male

Assistant Professor, Department of Electronics Engineering
Indian Institute of Technology (Indian School of Mines), Dhanbad

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Expertise

Electrical and Electronic Engineering

Publications

Total Articles 15

Books 0

Proceedings 0

Publications

Scopus

Citations 30

h-index 3

CrossRef

Citations 23

h-index 2

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Bio

Modelling of Analog And Mixed-Signal Circuits, Fault Modeling And Testing of VLSI Circuits, FPGA-Based Design

Personal Details

Male
Assistant Professor , Indian Institute of Technology (Indian School of Mines), Dhanbad
Indian Institute of Technology (Indian School of Mines) Dhanbad

PhD

Other Institute 2019

MS (By Research)

Other Institute 2012

B.E (ECE)

Other Institute 2005

Assistant Professor Jun 2013 – Present

Indian Institute of Technology (Indian School of Mines), Dhanbad | Department of Electronics Engineering

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Mr Haranath Rakshit

Junior Research Fellow

Organisations (418+)

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Prof Brijesh Kumar Mishra

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Co-Authors (3)

Dr Amit Patra

Indian Institute of Technology Kharagpur

Prof Santosh Biswas

Indian Institute of Technology, Bhilai

Prof Subindu Kumar

Indian Institute of Technology (Indian School of Mines), Dhanbad

Scholarly Work

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Scholarly Publications

SFG based fault simulation of linear analog circuits using fault classification and sensitivity analysis

Open Access

Conference Paper

Year: 2017. Volume: 711 , Pages: 179-190 .

Authors: Bhattacharya R.;Ragamai S.H.M.;Kumar S.

10.1007/978-981-10-7470-7_19

Parametric fault detection for instrumentation amplifier circuit

Open Access

Conference Paper

Year: 2016.

Authors: Rai A.;Bhattacharya R.

10.1109/ICRAIE.2016.7939582

FPGA based chip emulation system for test development of analog and mixed signal circuits: A case study of DC-DC buck converter

Open Access

Article

Year: 2012. Volume: 45 , Issue: 8 , Pages: 1997-2020 .

Authors: Bhattacharya R.;Biswas S.;Mukhopadhyay S.

10.1016/j.measurement.2012.04.022

FPGA based chip emulation system for test development and verification of analog and mixed signal circuits

Open Access

conference-abstract

Year: 2010.

Authors:

A new approach for test pattern generation for digital cores in mixed signal circuits

Open Access

Conference Paper

Year: 2007. Pages: 3-8 .

Authors: Rajaneesh M.;Bhattacharya R.;Biswas S.;Mukhopadhyay S.;Patra A.

10.1109/adcom.2007.119

A new approach for test pattern generation for digital cores in mixed signal circuits

Open Access

conference-paper

Year: 2007.

Authors:

A New Approach for Testing of Digital Modules in Mixed Signal VLSI Circuits

Open Access

conference-paper

Year: 2007.

Authors:

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