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Dr Janakiraman Viraraghavan

vidwan id: 67635
Male

Assistant Professor, Department of Electrical Engineering
Indian Institute of Technology Madras

Expertise

  • Electrical and Electronic Engineering

Publications

Total Articles 17
Books 0
Proceedings 0

Publications

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Scopus

Citations 114
h-index 7

CrossRef

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Citations 80
h-index 6
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Bio

Machine Learning Algorithms on Hardware, Statistical Analysis in VLSI

Personal Details

  • Male
  • Assistant Professor , Indian Institute of Technology Madras
  • Indian Institute Of Technology, Chennai, Tamil Nadu, India
Ph.D
Indian Institute of Science Bangalore 2010
Assistant Professor Nov 2016 – Present
Indian Institute of Technology Madras | Department of Electrical Engineering

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Scholarly Work

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Scholarly Publications

Flash based in-memory multiply-accumulate realisation: A theoretical study

Open Access
Conference Paper
Authors: Ashwin Balagopal S.;Viraraghavan J.
2

80-kb Logic Embedded High-K Charge Trap Transistor-Based Multi-Time-Programmable Memory with No Added Process Complexity

Open Access
Article
Authors: Jayaraman B.;Leu D.;Viraraghavan J.;Cestero A.;Yin M.;Golz J.;Tummuru R.R.;Raghavan R.;Moy D.;Kempanna T.;Khan F.;Kirihata T.;Iyer S.S.

A 14 nm 1.1 Mb embedded DRAM macro with 1 ns access

Open Access
Article
Authors: Fredeman G.;Plass D.W.;Mathews A.;Viraraghavan J.;Reyer K.;Knips T.J.;Miller T.;Gerhard E.L.;Kannambadi D.;Paone C.;Lee D.;Rainey D.J.;Sperling M.;Whalen M.;Burns S.;Tummuru R.R.;Ho H.;Cestero A.;Arnold N.;Khan B.A.;Kirihata T.;Iyer S.S.

80Kb 10ns read cycle logic Embedded High-K charge trap Multi-Time-Programmable Memory scalable to 14nm FIN with no added process complexity

Open Access
Conference Paper
Authors: Viraraghavan J.;Leu D.;Jayaraman B.;Cestero A.;Kilker R.;Yin M.;Golz J.;Tummuru R.R.;Raghavan R.;Moy D.;Kempanna T.;Khan F.;Kirihata T.;Iyer S.

Statistical compact model extraction: A neural network approach

Open Access
Article
Authors: Viraraghavan J.;Pandharpure S.J.;Watts J.

Voltage and temperature aware statistical leakage analysis framework using artificial neural networks

Open Access
Article
Authors: Janakiraman V.;Bharadwaj A.;Visvanathan V.

Voltage and temperature scalable gate delay and slew models including intra-gate variations

Open Access
Conference Paper
Authors: Das B.;Janakiraman V.;Amrutur B.;Jamadagni H.;Arvind N.

Voltage and temperature scalable standard cell leakage models based on stacks for statistical leakage characterization

Open Access
Conference Paper
Authors: Viraraghavan J.;Das B.P.;Amrutur B.