Ministry of Education
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Prof Manoj Pandey

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Expertise

  • Oncology

Publications

Total Articles 197
Books 0
Proceedings 0

Publications

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Scopus

Citations 4219
h-index 37

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Citations 458
h-index 10
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Professional Recognition

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Fellowship

Indian Association of Surgical Oncology IASO-Detroit

Community & Membership

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Bio

Surgical Oncology

Personal Details

  • Male
  • Banaras Hindu University, Ajagara
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Professor Jan 2010 – Jan 2020
Banaras Hindu University | Department of Surgical Oncology

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Co-Authors (19)

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Jagdish

Dr Jagdish Singh

Indian Institute of Vegetable Research

Manish

Dr Manish Kumar Singh

University of Allahabad

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Prof Mohan Kumar

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Manoj

Prof Manoj Pandey

Banaras Hindu University

M Radhakrishna

Dr M Radhakrishna Pillai

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Dr Vijaykumar M

Yenepoya (Deemed to be University), Mangalore

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Prof Nakul Chandra Aryya

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Dr Rakesh Pandey

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Prof Satyendra Kumar Tiwary

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Scholarly Work

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Scholarly Publications

Estimation of reliability in multi-component stress-strength model following a Burr distribution

Open Access
Article
Microelectronics Reliability. Year: 1991. Volume: 31 , Issue: 1 , Pages: 21-25 .
Authors: Pandey M.;Borhan Uddin M.
DOI 10.1016/0026-2714(91)90340-D
17

Selection of probability distribution for life testing data

Open Access
Article
Communications in Statistics - Theory and Methods. Year: 1991. Volume: 20 , Issue: 4 , Pages: 1373-1388 .
Authors: Pandey M.;Ferdous J.;Borhan Uddin M.
DOI 10.1080/03610929108830571
8

Prediction Limits for an Exponential Distribution: A Bayes Predictive Distribution Approach

Open Access
Article
IEEE Transactions on Reliability. Year: 1989. Volume: 38 , Issue: 5 , Pages: 599-602 .
Authors: Upadhyay S.K.;Pandey M.
DOI 10.1109/24.46488
5

Bayesian shrinkage estimation of reliability from a censored sample from a finite range failure time model

Open Access
Article
Microelectronics Reliability. Year: 1989. Volume: 29 , Issue: 6 , Pages: 955-958 .
Authors: Pandey M.;Singh V.P.
DOI 10.1016/0026-2714(89)90019-X
3

Bayesian inference in mixtures of two exponentials

Open Access
Article
Microelectronics Reliability. Year: 1988. Volume: 28 , Issue: 2 , Pages: 217-221 .
Authors: Pandey M.;Upadhyay S.K.
DOI 10.1016/0026-2714(88)90354-X
5

Bayesian shrinkage estimation of system reliability with Weibull distribution of components

Open Access
Article
Microelectronics Reliability. Year: 1987. Volume: 27 , Issue: 4 , Pages: 625-628 .
Authors: Pandey M.;Upadhyay S.K.
DOI 10.1016/0026-2714(87)90005-9
5

RELIABILITY ESTIMATION IN STRESS-STRENGTH MODELS: A BAYES APPROACH.

Open Access
Article
IEEE Transactions on Reliability. Year: 1986. Volume: R-35 , Issue: 1 , Pages: 98 .
Authors: Pandey M.;Upadhyay S.K.
DOI 10.1109/tr.1986.4335362
1

Bayes estimation of reliability in stress-strength model of Weibull distribution with equal scale parameters

Open Access
Article
Microelectronics Reliability. Year: 1986. Volume: 26 , Issue: 2 , Pages: 275-278 .
Authors: Pandey M.;Upadhyay S.K.
DOI 10.1016/0026-2714(86)90724-9
9