Ministry of Education
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Dr G.R. Jayanth

vidwan id: 54897
Male

Associate Professor, Instrumentation and Applied Physics
Indian Institute of Science Bangalore

Google Scholar Icon 13612167400 Researcher Icon D-1553-2010

Expertise

  • Multidisciplinary Physics

Publications

Total Articles 59
Books 0
Proceedings 0

Publications

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Scopus

Citations 347
h-index 12

CrossRef

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Citations 295
h-index 11
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Professional Recognition

2018

Instrument Society of India Young Scientist Award

Instrument Society of India

Community & Membership

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Instrument Society of India

Life member

Institute of Electrical and Electronic Engineers (IEEE)

Member

Bio

Precision motion Control, Nanometrology, Scanning Probe Microscopy, Design and Modeling of MEMS, Micromanipulation, Instrumentation for Real-World Applications.

Personal Details

  • Male
  • Associate Professor , Indian Institute of Science Bangalore
  • Indian Institute of Science
Ph.D.
The Ohio State University, Columbus, OH USA 2008
M.S
Other Institute 2004
B.Tech
Indian Institute of Technology Madras 2002
Associate Professor Oct 2016 – Present
Indian Institute of Science Bangalore | Instrumentation and Applied Physics
Assistant Professor Oct 2010 – Oct 2016
Indian Institute of Science Bangalore | Instrumentation and Applied Physics

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Co-Authors (6)

Atanu

Dr Atanu Mohanty

Indian Institute of Science Bangalore

Narayanan

Prof Narayanan G

Indian Institute of Science Bangalore

K.

Prof K. Rajanna

Indian Institute of Science Bangalore

Leema Rose

Dr Leema Rose Viannie

Vellore Institute of Technology, Vellore

Mohan Kumar

Prof Mohan Kumar M S

Indian Institute of Science Bangalore

Arun M.

Arun M. Umarji

Indian Institute of Science Bangalore

Scholarly Work

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Design, Fabrication and Development of Polymer Microcantilever for Flow Rate Measurement and Thermal Actuation

University Indian Institute of Science, Bengaluru
Year 2017

A Microrobotic System with Integrated Force Sensing Capability for Manipulation of Magnetic Particles in Three Dimensions

University Indian Institute of Science, Bengaluru
Year 2019

A Probing System for Dynamic Mode Atomic Force Microscopy Based on Specialized Probes

University Indian Institute of Science, Bengaluru
Year 2017

A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology

University Indian Institute of Science, Bengaluru
Year 2017

Intrusion detection system

INDIAN INSTITUTE OF SCIENCE
- Patent No. : IN202341046633 Filed : 11-07-2023
Published : 01-09-2023 Published

Positioning of payloads

INDIAN INSTITUTE OF SCIENCE
- Patent No. : IN202141015720 Filed : 01-04-2021
Published : 21-10-2022 Published

System for trapping and manipulation of magnetic particles

INDIAN INSTITUTE OF SCIENCE
- Patent No. : IN202041041503 Filed : 24-09-2020
Published : 25-03-2022 Published

PROBE FOR HIGH SPEED ATOMIC FORCE MICROSCOPY

INDIAN INSTITUTE OF SCIENCE
IN
- Patent No. : IN201841019216A Filed : 07-08-2018
Published : 14-02-2020 Published

MICRO-SCALE BALL-AND-SOCKET JOINT

INDIAN INSTITUTE OF SCIENCE
IN
- Patent No. : IN201741039295A Filed : 03-12-2017
Published : 31-07-2020 Published

MULTIPLE MOTION MEASUREMENT

INDIAN INSTITUTE OF SCIENCE
- Patent No. : IN201502017I4 Filed : 20-04-2015
Published : 21-10-2016 Published

REUSABLE PROBE TIP FOR A SCANNING PROBE MICROSCOPE

INDIAN INSTITUTE OF SCIENCE
- Patent No. : 398463 Filed : 13-04-2015
Published : 02-06-2022 Granted

AN AUTOMATED REALTIME VEHICLE CLASSIFICATION SYSTEM

INDIAN INSTITUTE OF SCIENCE
- Patent No. : IN201301213I4 Filed : 20-03-2013
Published : 23-01-2015 Published

Scholarly Publications

Control of tip-to-sample distance in atomic force microscopy: A dual-actuator tip-motion control scheme

Open Access
Article
Review of Scientific Instruments. Year: 2007. Volume: 78 , Issue: 9 .
Authors: Jeong Y.;Jayanth G.R.;Menq C.H.
DOI 10.1063/1.2785158
14 16

Direct tip-sample interaction force control for the dynamic mode atomic force microscopy

Open Access
Article
Applied Physics Letters. Year: 2006. Volume: 88 , Issue: 20 .
Authors: Jeong Y.;Jayanth G.R.;Jhiang S.M.;Menq C.H.
DOI 10.1063/1.2203958
18 20

Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy

Open Access
Article
Review of Scientific Instruments. Year: 2006. Volume: 77 , Issue: 5 .
Authors: Jayanth G.R.;Jeong Y.;Menq C.H.
DOI 10.1063/1.2200874
18 17