Ministry of Education
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Dr Ramakrishnan Valayathoor Narayanan

vidwan id: 191673
Male

Associate Professor, School of Electronics Engineering
Vellore Institute of Technology, Vellore

Orchid Icon 0000-0002-7746-7982 Google Scholar Icon 42161987800 Researcher Icon AAW-8021-2020 Google Scholar Icon z2G5ntYAAAAJ

Expertise

  • Electrical and Electronic Engineering

Publications

Total Articles 36
Books 0
Proceedings 0

Publications

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Scopus

Citations 102
h-index 6

CrossRef

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Citations 78
h-index 5
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Professional Recognition

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Community & Membership

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Bio

modeling radiation-hardened memory circuits. Also in design of vertical GaN-based power MOSFETs.

Personal Details

  • Male
  • Associate Professor , Vellore Institute of Technology, Vellore
  • Vellore Institute Technology
PhD
Other Institute 2015
Associate Professor Feb 2013 – Present
Vellore Institute of Technology, Vellore | School of Electronics Engineering

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Co-Authors (13)

Arun Samuel

Dr Arun Samuel TS

National Engineering College, Thoothukkudi

Vimala

Dr Vimala P

Dayananda Sagar College of Engineering, BANGALORE

Vivek Anand

Dr Vivek Anand I

National Engineering College, Thoothukkudi

Usha

Usha Chennoji

Dayananda Sagar College of Engineering, BANGALORE

Murugapandiyan

Dr Murugapandiyan P

Anil Neerukonda Institute Of Technology & Sciences, Visakhapatnam

Balamurugan

Dr Balamurugan N B

Thiagarajar College of Engineering

Nilesh Kumar

Dr Nilesh Kumar Jaiswal

Shri Vishnu Engineering College for Women, Vishnupur

Suveetha

Dr Suveetha Dhanaselvam P

N/A

Rajyalakshmi

Dr Rajyalakshmi Parvathini

Anil Neerukonda Institute Of Technology & Sciences, Visakhapatnam

Sridevi

Dr Sridevi Sriadibhatla

Vellore Institute of Technology, Vellore

V V Satyanarayana

Dr V V Satyanarayana Satti

Sri Vasavi Engineering College, Pedatadepalli, Tadepalligudem

Usha

Ms Usha C

Dayananda Sagar College of Engineering, BANGALORE

Vijay

Dr Vijay H M

KLE Technological University

Scholarly Work

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Scholarly Publications

Electrostatic characteristics of a high-k stacked gate-all-around heterojunction tunnel field-effect transistor using the superposition principle

Open Access
Article
Journal of Computational Electronics. Year: 2022. Volume: 21 , Issue: 1 , Pages: 181-190 .
Authors: Usha C.;Vimala P.;Ramkumar K.;Ramakrishnan V.N.
2

Pressure Sensors Using Si/ZnO Heterojunction Diode

Open Access
Article
Year: 2022. Volume: 14 , Issue: 8 , Pages: 4121-4127 .
Authors: Dhanaselvam P.S.;Kumar D.S.;Ramakrishnan V.N.;Ramkumar K.;Balamurugan N.B.
DOI 10.1007/s12633-021-01177-2
9 5

Influence of trap carriers in SiO<inf>2</inf>/HfO<inf>2</inf> stacked dielectric cylindrical gate tunnel fet

Open Access
Article
Year: 2022. Volume: 14 , Issue: 9 , Pages: 4589-4600 .
Authors: Anand I.V.;Samuel T.S.A.;Ramakrishnan V.N.;Ram Kumar K.
DOI 10.1007/s12633-021-01263-5

Conductive Filament Variation of RRAM and Its Impact on Single Event Upset

Open Access
Article
Transactions on Electrical and Electronic Materials. Year: 2022. Volume: 23 , Issue: 3 , Pages: 247-253 .
Authors: Vijay H.M.;Ramakrishnan V.N.
DOI 10.1007/s42341-021-00343-y

Geometrical Variation of a Conductive Filament in RRAM and Its Impact on a Single-Event Upset

Open Access
Article
Year: 2022. Volume: 20 , Issue: 1 , Pages: 32-38 .
Authors: Vijay H.M.;Ramakrishnan V.N.
DOI 10.37936/ecti-eec.2022201.246101

Performance Analysis of Germanium-Silicon Vertical Tunnel Field-Effect Transistors (Ge-Si-VTFETs) for Analog/RF Applications

Open Access
Article
Year: 2022.
Authors: Ramkumar K.;Ramakrishnan V.N.
DOI 10.1007/s12633-022-01802-8

Temperature Dependent Carrier Transport in Hydrogenated Amorphous Semiconductors for Thin Film Memristive Applications

Open Access
Conference Paper
Materials Science Forum. Year: 2022. Volume: 1048 MSF , Pages: 182-188 .
Authors: Chakraverty M.;Ramakrishnan V.N.
DOI 10.4028/www.scientific.net/MSF.1048.182

A Novel Approach to Analyze the Resistance of the RRAM Based on the Conductive Nano Filament Length and Width Variation

Open Access
Article
Transactions on Electrical and Electronic Materials. Year: 2022. Volume: 23 , Issue: 5 , Pages: 476-482 .
Authors: Vijay H.M.;Ramakrishnan V.N.
DOI 10.1007/s42341-021-00374-5
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